Inspecting the invisible with SWIR cameras

Visible light (left) | SWIR 1,300 nm (right):

Inspection of coffee beans for dark foreign particles that are barely visible to the human eye (tiny stones)
Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 1,450 nm (right):

Inspection of fruit like apples for any damage invisible to the human eye
Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 1,550 nm (right):

Detection of alignment features invisible to the human eye, for example positioning in wafer production
Pictures: Sony Semiconductor Solutions Corporation

Example: Reliable detection and identification of damaged sports (as caused by pressure, rot) for efficient quality assurance

Example: High-precision wafer positioning and inspection through multiple layers

Example: Identification of impurities and identification of substances in different types of packaging such as glass or plastic

The sensor temperature must be as low as possible to minimize defect pixels and keep the dark current low.

• Very low power consumption (2.1 W@12 V)
• Bigger housing of 36×36 mm
• Patented embedded cooling fin in the housing for effective heat dissipation

A perfect pixel correction must be integrated into the camera firmware.

• Combination of static and dynamic correction of defect pixels
  • Most defect pixels will be corrected by the static correction
  • Dynamic correction can correct “defect pixels” which occur at varying settings or conditions 

High precision image data and faster measuring cycle times due to the integrated cooling pipe.

• Further reduction of defect pixels by lowering the operating temperature
• Prevents heat from entering the optics
• Reduces pixel drift to a minimum 
• Enables fast and high precision measurements after power-up
• Especially in tight installation situations