Inspect the invisible

Visible light (left) | SWIR 1,300 nm (right):

Inspection of coffee beans for dark foreign particles that are barely visible to the human eye (tiny stones)
Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 1,450 nm (right):

Inspection of fruit like apples for any damage invisible to the human eye
Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 1,550 nm (right):

Detection of alignment features invisible to the human eye, for example positioning in wafer production
Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 365 nm (right):

Inspection of metal materials for damage such as scratches, impacts, etc.
Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 365 nm (right):

Inspection and differentiation of transparent plastic materials in the recycling process

(1) PET (polyethylene terephthalate)
(2) PC (polycarbonate)
(3) PMMA (polymethyl methacrylate; acrylic glass)
(4) PVC (polyvinyl chloride)

Pictures: Sony Semiconductor Solutions Corporation

Visible light (left) | SWIR 365 nm (right):

Inspection for defects in transparent resin coating in the electronics industry

(1) With synthetic resin coating
(2) Without synthetic resin coating

Pictures: Sony Semiconductor Solutions Corporation

Monochrome camera (left) | Polarization camera (right):

Checking product packaging and imprints by suppressing reflections

Monochrome camera (left) | Polarization camera (right):

Inspection on residual stress (direction and degree) on glass using back light

Monochrome camera (left) | Polarization camera (right):

Inspections of the carbon fiber fabrics (CFRP) layers for position and deformation