Inspection of metal materials for damage such as scratches, impacts, etc. Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 365 nm (right):
Inspection and differentiation of transparent plastic materials in the recycling process
(1) PET (polyethylene terephthalate) (2) PC (polycarbonate) (3) PMMA (polymethyl methacrylate; acrylic glass) (4) PVC (polyvinyl chloride)
Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 365 nm (right):
Inspection for defects in transparent resin coating in the electronics industry
(1) With synthetic resin coating (2) Without synthetic resin coating
Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,300 nm (right):
Inspection of coffee beans for dark foreign particles that are barely visible to the human eye (tiny stones) Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,450 nm (right):
Inspection of fruit like apples for any damage invisible to the human eye Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,550 nm (right):
Detection of alignment features invisible to the human eye, for example positioning in wafer production Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,550 nm (right):
Detection of alignment features invisible to the human eye, for example positioning in wafer production Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 365 nm (right):
Inspection for defects in transparent resin coating in the electronics industry
(1) With synthetic resin coating (2) Without synthetic resin coating
Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,550 nm (right):
Detection of alignment features invisible to the human eye, for example positioning in wafer production Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,300 nm (right):
Inspection of coffee beans for dark foreign particles that are barely visible to the human eye (tiny stones) Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,450 nm (right):
Inspection of fruit like apples for any damage invisible to the human eye Pictures: Sony Semiconductor Solutions Corporation
Visible light (left) | SWIR 1,550 nm (right):
Detection of alignment features invisible to the human eye, for example positioning in wafer production Pictures: Sony Semiconductor Solutions Corporation
