Short Wave Infrared (SWIR) Kameras

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Hohe Sensitivität

Hohe Sensitivität von 400–1700 nm im Bereich sichtbaren und unsichtbaren Lichts durch Sony SenSWIR InGaAs Sensoren

Leistungsstarke Bildqualität

Mit bis zu 71 fps und 1,3 MP optimale Bildqualität für zahlreiche Anwendungen

Standardisierte Schnittstelle

GigE Vision Schnittstelle für effiziente Datenübertragung sowie einfache Integration

Industrietaugliches Design

Gehäusegrösse von 36×36 mm mit patentierter thermischer Anbindung des Sensors sowie optionalem patentierten, integrierten Kühlkanal für hochpräzise Bilddaten

ATTENTION: This product is subject to statutory export control regulations and may require written information on intended end use and final destination! Dual Use Classification ECCN/AL: 6A003B

Die Baumer SWIR-Industriekameras der CX.XC-Serie sind industrietaugliche GigE-Vision Kurzwellen-Infrarot-Kameras. Ihre hochempfindlichen Sony SenSWIR InGaAs-Sensoren ermöglichen die Bilderfassung sowohl im sichtbaren als auch im nicht-sichtbaren Lichtspektrum von 400–1700 nm Wellenlänge.

Dadurch bietet die Technologie neue Anwendungsmöglichkeiten mit hoher Präzision zum Beispiel in der Lebensmittelproduktion, Halbleiter- und Pharmaindustrie.

Applikationsbeispiele SWIR

Sichtbares Licht (links) | SWIR 1300 nm (rechts):

Inspektion von Kaffeebohnen auf dunkle und für das menschliche Auge kaum sichtbare Fremdkörper (wie bspw. Steine)
Bilder: Sony Semiconductor Solutions Corporation

Sichtbares Licht (links) | SWIR 1450 nm (rechts):

Inspektion von Obst wie bspw. Äpfel auf für das menschliche Auge unsichtbare Schadstellen
Bilder: Sony Semiconductor Solutions Corporation

Sichtbares Licht (links) | SWIR 1550 nm (rechts):

Erkennen von für das menschliche Auge unsichtbaren Ausrichtungsmerkmalen zur Positionierung in der Waferproduktion
Bilder: Sony Semiconductor Solutions Corporation

Short Wavelength Infrared (SWIR) Technologie

Food industry

Example: Reliable detection and identification of damaged sports (as caused by pressure, rot) for efficient quality assurance

Semiconductor industry

Example: High-precision wafer positioning and inspection through multiple layers

Pharmaceutical industry

Example: Identification of impurities and identification of substances in different types of packaging such as glass or plastic

Defect Pixel Correction

How to avoid defect pixels for SWIR applications – made by Baumer

InGaAs sensors show significant more defect pixels due to technology compared to silicon-based CMOS sensors.

Example: Image without any corrections (left) | Image with combined static and dynamic defect pixel correction (right)
(Image acquisition Sony IMX990: 1,350 nm, Use at ambient temperature: typical temperature at the image sensor 35°C)

Why is it important to avoid defect pixels?
To reach an excellent image quality and a stable running image processing system each avoided defect pixel counts.

What needs to be considered when using cameras with InGaAS sensors?
A low temperature at the image sensor is crucial in order to keep the number of defect pixels low.

The solution – made by Baumer
CX.SWIR.XC cameras provide a combination of both a perfect thermal industrial design and an integrated static and dynamic defect pixel correction matched to the sensor. The temperature at the image sensor can be further reduced by using the integrated cooling pipe.

1. Avoid defect pixels

The sensor temperature must be as low as possible to minimize defect pixels and keep the dark current low.

Very low power consumption (2.1 W@12 V)
- Less heat in the camera
Bigger housing of 36×36 mm
- Reduces the temperature at the sensor
Patented embedded cooling fin in the housing
- Effective heat dissipation off the electronic components

2. Additional defect pixel correction

A perfect pixel correction must be integrated into the camera firmware.

Combination of static and dynamic correction of defect pixels
- Most defect pixels will be corrected by the static correction
- Dynamic correction can correct “defect pixels” which occur at varying settings or conditions

3. Integrated cooling pipe can be used optionally

High precision image data and faster measuring cycle times due to the integrated cooling pipe.

Further reduction of defect pixels by lowering the operating temperature
Prevents heat from entering the optics
Reduces pixel drift to a minimum
Enables fast and high precision measurements after power-up
Especially in tight installation situations

Unsichtbares inspizieren mit SWIR Kameras

Höchste Präzision im infraroten Spektralbereich

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